AMETEK Land to Present on Particulate Matter Continuous Emissions Monitoring Systems at CEM India 2019 - CLAIM YOUR FREE VIP TICKET

Tuesday, June 25, 2019

CEM INDIA 2019
AMETEK Land will deliver a technical presentation on particulate matter continuous emissions monitoring systems (PM CEMS) at CEM India Emissions Monitoring Conference and Exhibition, happening September 24 – 26 in New Delhi, India (Stand No. 58).

Derek Stuart, Global Product Manager – Power, Combustion and Environmental at AMETEK Land will present “Choosing the right measurement technology for a PM-CEMS” as part of the particulate monitoring session.

CLAIM YOUR FREE VIP TICKET FOR CEMThe presentation looks at the physical principles underlying the most widely used PM measurement techniques and considers a wide variety of methods, such as commercial instruments employing transmissometry, laser light scattering, charge transfer and beta ray absorption, and then instrument approvals and compliance with standards. 

Derek Stuart explains: “Progress is being made to improve the environmental performance of the power generation industry in India.  The key to this is accurate measurement of stack emissions, however the choice of monitors can be overwhelming. No one method is ideal for all applications – the best choice depends on the emission limit, the nature of the process and the availability of skilled personnel to service the instruments. In my presentation, I will look at the best options for a number of the most common measurement scenarios.” 

Following on from the successes of the first CEM India conference and exhibition, AMETEK Land will return this year to demonstrate its range of high-accuracy opacity and particulate matter (PM) monitors as well as its portable gas analyser, the Lancom 4, which is capable of measuring up to eight flue gases in a range of combustion and emissions processes.
India is among the world's fastest growing economies and currently has some of the worst air pollution, ranking tenth in the list of median PM concentrations published by the World Health Organization. To tackle that issue, the Central Pollution Control Board (CPCB) of India has taken an important step to adopt Continuous Emissions Monitoring (CEM) Systems. 

At the exhibition, AMETEK Land will exhibit its 4500 MkIII opacity and a new opacity monitor, soon to be released, which set the industry standards for compliance opacity and dust concentration monitoring. With its patented technologies, the 4500 MkIII monitor achieves the highest available specification for the principal performance parameters as defined by the internationally recognized ASTM Standard D 6216-12.

In addition, AMETEK Land’s Lancom 4 portable gas analyser ensures ease-of-use on site for combustion efficiency and emissions monitoring measurements in all boiler system and pollutant gas processes. The Lancom 4 advanced sample conditioning system can monitor up to nine different gases and carry out a total of 17 measurement parameters simultaneously, offering a very high level of accuracy.

4500 MKlll at CEM India 2019All AMETEK Land systems on display at CEM India 2019 have industrial applications in the power sector for improving process control, quality assurance and control and reduced life-cycle costs.

Following on from the success of the first CEM India event held in 2017, the forthcoming CEM India conference is set to provide international delegates and visitors with in-depth information on Indian regulation and policy, monitoring guidelines, calibration and quality control.

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About Derek Stuart

Derek Stuart, Global Product Manager - PowerDerek Stuart is AMETEK Land's Global Product Manager for Power, Combustion and Environmental and has more than 25 years' experience in industrial gas measurements. As a product development specialist, he was responsible for the design of several continuous emissions monitors, including the successful 4500 opacity monitor, which is used to monitor particulate matter emissions in stack gases worldwide. He is a Chartered Physicist, a member of ASTM with contributions to several ASTM standards, and holds two patents in the field of opacity monitoring.